@Article{CiCP-6-433,
author = {},
title = {Geometric Evolution Laws for Thin Crystalline Films: Modeling and Numerics},
journal = {Communications in Computational Physics},
year = {2009},
volume = {6},
number = {3},
pages = {433--482},
abstract = {<p style="text-align: justify;">Geometrical evolution laws are widely used in continuum modeling of surface
and interface motion in materials science. In this article, we first give a brief review
of various kinds of geometrical evolution laws and their variational derivations,
with an emphasis on strong anisotropy. We then survey some of the finite element
based numerical methods for simulating the motion of interfaces focusing on the field
of thin film growth. We discuss the finite element method applied to front-tracking,
phase-field and level-set methods. We describe various applications of these geometrical
evolution laws to materials science problems, and in particular, the growth and
morphologies of thin crystalline films.</p>},
issn = {1991-7120},
doi = {https://doi.org/},
url = {http://global-sci.org/intro/article_detail/cicp/7688.html}
}