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Volume 35, Issue 5
Detection of Electromagnetic Inclusions Using Topological Sensitvity

Abdul Wahab, Tasawar Abbas, Naveed Ahmed & Qazi Muhammad Zaigham Zia

J. Comp. Math., 35 (2017), pp. 642-671.

Published online: 2017-10

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  • Abstract

In this article, a topological sensitivity framework for far-field detection of a diametrically small electromagnetic inclusion is established. The cases of single and multiple measurements of the electric far-field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of its resolution and sensitivity for locating an inclusion. The stability of the framework with respect to measurement and medium noises is discussed. Moreover, the quantitative results for signal-to-noise ratio are presented. A few numerical results are presented to illustrate the detection capabilities of the proposed framework with single and multiple measurements.

  • AMS Subject Headings

35L05, 35R30, 74B05, 47A52, 65J20.

  • Copyright

COPYRIGHT: © Global Science Press

  • Email address

wahab@kaist.ac.kr (Abdul Wahab)

tasawar44@hotmail.com (Tasawar Abbas)

ahmed@wias-berlin.de (Naveed Ahmed)

zaighum_zia@comsats.edu.pk (Qazi Muhammad Zaigham Zia)

  • BibTex
  • RIS
  • TXT
@Article{JCM-35-642, author = {Wahab , AbdulAbbas , TasawarAhmed , Naveed and Zaigham Zia , Qazi Muhammad}, title = {Detection of Electromagnetic Inclusions Using Topological Sensitvity}, journal = {Journal of Computational Mathematics}, year = {2017}, volume = {35}, number = {5}, pages = {642--671}, abstract = {

In this article, a topological sensitivity framework for far-field detection of a diametrically small electromagnetic inclusion is established. The cases of single and multiple measurements of the electric far-field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of its resolution and sensitivity for locating an inclusion. The stability of the framework with respect to measurement and medium noises is discussed. Moreover, the quantitative results for signal-to-noise ratio are presented. A few numerical results are presented to illustrate the detection capabilities of the proposed framework with single and multiple measurements.

}, issn = {1991-7139}, doi = {https://doi.org/10.4208/jcm.1609-m2016-0498}, url = {http://global-sci.org/intro/article_detail/jcm/10036.html} }
TY - JOUR T1 - Detection of Electromagnetic Inclusions Using Topological Sensitvity AU - Wahab , Abdul AU - Abbas , Tasawar AU - Ahmed , Naveed AU - Zaigham Zia , Qazi Muhammad JO - Journal of Computational Mathematics VL - 5 SP - 642 EP - 671 PY - 2017 DA - 2017/10 SN - 35 DO - http://doi.org/10.4208/jcm.1609-m2016-0498 UR - https://global-sci.org/intro/article_detail/jcm/10036.html KW - Electromagnetic imaging, Topological derivative, Localization, Resolution analysis, Stability analysis, Medium noise, Measurement noise. AB -

In this article, a topological sensitivity framework for far-field detection of a diametrically small electromagnetic inclusion is established. The cases of single and multiple measurements of the electric far-field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of its resolution and sensitivity for locating an inclusion. The stability of the framework with respect to measurement and medium noises is discussed. Moreover, the quantitative results for signal-to-noise ratio are presented. A few numerical results are presented to illustrate the detection capabilities of the proposed framework with single and multiple measurements.

AbdulWahab, TasawarAbbas, NaveedAhmed & Qazi MuhammadZaigham Zia. (2020). Detection of Electromagnetic Inclusions Using Topological Sensitvity. Journal of Computational Mathematics. 35 (5). 642-671. doi:10.4208/jcm.1609-m2016-0498
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