Reconstruction of Small Inclusions in Electrical Impedance Tomography Problems

Authors

  • Xiaoping Fang, Youjun Deng & Xiaohong Chen

DOI:

https://doi.org/10.4208/eajam.030518.210918

Keywords:

Electrical impedance tomography, small inclusion, inverse problem, uniqueness.

Abstract

An inverse problem to recover small inclusions inside a two-layer structure is considered. Integral representations for the solution of two-layer inhomogeneous conductivity problem are derived and asymptotic expansions of a perturbed electrical field are obtained. Moreover, the uniqueness of the recovery of the locations and conductivities of small inclusions is proved.

Published

2019-03-26

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Articles